Share Email Print
cover

Proceedings Paper

Observation of photoexcited emission clusters in the bulk of KDP and laser conditioning under 355-nm irradiation
Author(s): Stavros G. Demos; Michael C. Staggs; Ming Yan; Harry B. Radousky; James J. De Yoreo
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Defect clusters in the bulk of large KDP crystals are revealed using a microscopic fluorescence imaging system and CW laser illumination. Exposure of the crystal to high power 355-nm, 3-ns laser irradiation leads to a significant reduction of the number of observed optically active centers. The initially observed defect cluster concentration is approximately 104-106 per mm3 depending on the crystal growth method and sector of the crystal. The number of defect clusters can be reduced by a factor of 102 or more under exposure to 355-nm laser irradiation while their average intensities also decreases. Spectroscopic measurements provide information on the electronic structure of the defects.

Paper Details

Date Published: 7 April 1999
PDF: 7 pages
Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, (7 April 1999); doi: 10.1117/12.344402
Show Author Affiliations
Stavros G. Demos, Lawrence Livermore National Lab. (United States)
Michael C. Staggs, Lawrence Livermore National Lab. (United States)
Ming Yan, Lawrence Livermore National Lab. (United States)
Harry B. Radousky, Lawrence Livermore National Lab. (United States)
James J. De Yoreo, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 3578:
Laser-Induced Damage in Optical Materials: 1998
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

© SPIE. Terms of Use
Back to Top