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Proceedings Paper

Refractive index profile reconstruction from near-field measurements: analysis and assessment
Author(s): Guido Perrone; Gabriella Motta; Daniel Pircalaboiu; Frederica Cappelluti; Ivo Montrosset
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Paper Abstract

In this paper we present a critical analysis on the refractive index profile reconstruction from near field measurements. We show that the near field information is not sufficient to uniquely determine the proper index parameters if the refractive index shape it is not already known a priori and then we propose a technique to refine the results found from the inversion. Experimental verifications in the case of waveguides made by ion exchange in a glass substrate confirm the results obtained with simulations.

Paper Details

Date Published: 26 March 1999
PDF: 8 pages
Proc. SPIE 3620, Integrated Optics Devices III, (26 March 1999); doi: 10.1117/12.343742
Show Author Affiliations
Guido Perrone, Politecnico di Torino (Italy)
Gabriella Motta, Politecnico di Torino (Italy)
Daniel Pircalaboiu, Politecnico di Torino (Romania)
Frederica Cappelluti, Politecnico di Torino (Italy)
Ivo Montrosset, Politecnico di Torino (Italy)


Published in SPIE Proceedings Vol. 3620:
Integrated Optics Devices III
Giancarlo C. Righini; S. Iraj Najafi, Editor(s)

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