Share Email Print
cover

Proceedings Paper

Measurements of thin film disks by surface reflectance analysis
Author(s): David Klein; Gerard H. Vurens
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Scanning Reflectance AnalysisTM (SRATM) is an emerging technique that has been rapidly gaining acceptance as a powerful tool for the analysis of thin film disks. This is because the technique provides a means to generate high resolution maps of the thickness and composition of lubricant, overcoat, and contaminant films on a disk in about ten seconds. Common quality assurance applications have included overcoat thickness, composition, and uniformity measurements as well as substrate polish quality measurements and stain identification. Applications in failure analysis have included lubricant pooling and degradation, carbon wear, corrosion, and contaminant detection. This paper will focus on the design and principle of operation of a SRA. The discussion will include the general theory that governs the machine's design and the data it produces as well as some details that maximize performance and simplify data interpretation. Following this, a few example applications of the technique will be presented.

Paper Details

Date Published: 29 March 1999
PDF: 9 pages
Proc. SPIE 3619, Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays, (29 March 1999); doi: 10.1117/12.343708
Show Author Affiliations
David Klein, HDI Instrumentation (United States)
Gerard H. Vurens, HDI Instrumentation (United States)


Published in SPIE Proceedings Vol. 3619:
Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays
John C. Stover, Editor(s)

© SPIE. Terms of Use
Back to Top