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Proceedings Paper

Growth and characterization of YAG:Cr4+epitaxial films
Author(s): Sergii B. Ubizskii; Igor M. Syvorotka; Sergii S. Melnyk; Andrej O. Matkovskii; Krzysztof Kopczynski; Zygmunt Mierczyk; Zygmunt Frukacz
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Paper Abstract

Epitaxial films with thickness of 10 - 250 micrometers of yttrium aluminum garnet (YAG) doped with Cr were grown by liquid phase epitaxy technique on YAG:Nd substrates. Co-doping with Mg2+ is used to force the Cr4+ valent state formation. Dependence of absorption spectra of obtained films on melt-solution composition, growth conditions and thermal treatment in reducing and oxidizing atmospheres is studied. A very intensive absorption band in UV region with maximum at 275 nm was found both in co-doped and YAG:Mg2+ epifilms caused probably by oxygen vacancies compensating the excess charge of Mg2+. Its intensity correlates with Cr4+ content in the film in that way: it decreases with Cr4+ entering in the film. The absorption being characteristic for YAG:Cr4+ crystals is found in co-doped films grown at higher temperatures (1000 - 1100 degree(s)C). The processes occurring during annealing are discussed.

Paper Details

Date Published: 24 March 1999
PDF: 5 pages
Proc. SPIE 3724, International Conference on Solid State Crystals '98: Single Crystal Growth, Characterization, and Applications, (24 March 1999); doi: 10.1117/12.343022
Show Author Affiliations
Sergii B. Ubizskii, Institute of Materials and State Univ. Lvivska Politechnica (Ukraine)
Igor M. Syvorotka, Institute of Materials (Ukraine)
Sergii S. Melnyk, State Univ. Lvivska Politechnica (Ukraine)
Andrej O. Matkovskii, Institute of Materials and State Univ. Lvivska Politechnica (Ukraine)
Krzysztof Kopczynski, Military Univ. of Technology (Poland)
Zygmunt Mierczyk, Military Univ. of Technology (Poland)
Zygmunt Frukacz, Institute of Electronic Materials Technology (Poland)


Published in SPIE Proceedings Vol. 3724:
International Conference on Solid State Crystals '98: Single Crystal Growth, Characterization, and Applications
Andrzej Majchrowski; Jerzy Zielinski, Editor(s)

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