Share Email Print
cover

Proceedings Paper

Reliability of determination of electron traps depths in crystals using thermoluminescence methods
Author(s): T. Lukas; A. Opanowicz
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Fourteen methods of the trap depth determination from the thermoluminescence (TL) curves have been examined by applying these methods to numerically calculated TL curves. The heating-rate methods of Hoogenstraaten, Haering and Adams, Chen and Winer, and Opanowicz yield the correct values of trap depths.

Paper Details

Date Published: 24 March 1999
PDF: 5 pages
Proc. SPIE 3724, International Conference on Solid State Crystals '98: Single Crystal Growth, Characterization, and Applications, (24 March 1999); doi: 10.1117/12.342991
Show Author Affiliations
T. Lukas, Technical Univ. of Lodz (Poland)
A. Opanowicz, Technical Univ. of Lodz (Poland)


Published in SPIE Proceedings Vol. 3724:
International Conference on Solid State Crystals '98: Single Crystal Growth, Characterization, and Applications
Andrzej Majchrowski; Jerzy Zielinski, Editor(s)

© SPIE. Terms of Use
Back to Top