Share Email Print
cover

Proceedings Paper

Improved backward ray tracing with stochastic sampling
Author(s): Seung Taek Ryu; Kyung-Hyun Yoon
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper presents a new technique that enhances the diffuse interreflection with the concepts of backward ray tracing. In this research, we have modeled the diffuse rays with the following conditions. First, as the reflection from the diffuse surfaces occurs in all directions, it is impossible to trace all of the reflected rays. We confined the diffuse rays by sampling the spherical angle out of the reflected rays around the normal vector. Second, the traveled distance of reflected energy from the diffuse surface differs according to the object's property, and has a comparatively short reflection distance. Considering the fact that the rays created on the diffuse surfaces affect relatively small area, it is very inefficient to trace all of the sampled diffused rays. Therefore, we set a fixed distance as the critical distance and all the rays beyond this distance are ignored. The result of this research is that as the improved backward ray tracing can model the illumination effects such as the color bleeding effects, we can replace the radiosity algorithm under the limited environment.

Paper Details

Date Published: 25 March 1999
PDF: 8 pages
Proc. SPIE 3643, Visual Data Exploration and Analysis VI, (25 March 1999); doi: 10.1117/12.342843
Show Author Affiliations
Seung Taek Ryu, ChungAng Univ. (South Korea)
Kyung-Hyun Yoon, ChungAng Univ. (South Korea)


Published in SPIE Proceedings Vol. 3643:
Visual Data Exploration and Analysis VI
Robert F. Erbacher; Philip C. Chen; Craig M. Wittenbrink, Editor(s)

© SPIE. Terms of Use
Back to Top