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Proceedings Paper

Infrared imaging of temperature distribution in a high-temperature x-ray diffraction furnace
Author(s): Hsin Wang; E. Andrew Payzant
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Paper Abstract

High Temperature X-ray Diffraction (HTXRD) is a very powerful tool for studies of reaction kinetics, phase transformations, and lattice thermal expansion of advanced materials. Accurate temperature measurement is a critical part of the technique. Traditionally, thermocouples, thermisters, and optical pyrometers have been used for temperature control and measurement, and temperature could only be measured at a single point. Infrared imaging was utilized in this study to characterize the thermal gradients resulting from various sample and furnace configurations in a commercial strip heater furnace. Furnace configurations include a metallic strip heater, with and without a secondary surround heater, or surround heater alone. Sample configurations include low and high thermal conductivity powders and solids. The IR imaging results have been used to calibrate sample temperatures in the HTXRD furnace.

Paper Details

Date Published: 19 March 1999
PDF: 9 pages
Proc. SPIE 3700, Thermosense XXI, (19 March 1999); doi: 10.1117/12.342329
Show Author Affiliations
Hsin Wang, Oak Ridge National Lab. (United States)
E. Andrew Payzant, Oak Ridge National Lab. (United States)

Published in SPIE Proceedings Vol. 3700:
Thermosense XXI
Dennis H. LeMieux; John R. Snell Jr., Editor(s)

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