Share Email Print
cover

Proceedings Paper

Defect detection in pulsed thermography: a comparison of Kohonen and Perceptron neural networks
Author(s): Steve Vallerand; A. Darabi; Xavier P. Maldague
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this paper, two neural network approaches are compared for defect detection using thermal evolution, phase and amplitude data acquired in the pulsed thermography approach with pulsed phase thermography processing. The tested approaches are based on Perceptron and Kohonen neural networks. Examples of results are presented for each technique with the three types of available data, in the case of flat-bottom holes in aluminum. Results show that the Perceptron using phase data gives better results being less influenced by disturbances.

Paper Details

Date Published: 19 March 1999
PDF: 6 pages
Proc. SPIE 3700, Thermosense XXI, (19 March 1999); doi: 10.1117/12.342292
Show Author Affiliations
Steve Vallerand, Univ. Laval (Japan)
A. Darabi, Univ. Laval (Canada)
Xavier P. Maldague, Univ. Laval (Canada)


Published in SPIE Proceedings Vol. 3700:
Thermosense XXI
Dennis H. LeMieux; John R. Snell, Editor(s)

© SPIE. Terms of Use
Back to Top