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Proceedings Paper

Coherent optical methods of dynamic parameter diagnostics of microwave transistors
Author(s): Garif G. Akchurin
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Paper Abstract

Coherent optical time, frequency and heterodyne domain methods of dynamic parameters diagnostic of microwave transistors are discussed. Possibilities of optoelectronic and electrooptic station at the probing by picosecond pulses using mode-locked laser are considered. Peculiarities of microwave modulation of injective heterolaser and MESFET dynamic photoresponse are discussed. The determination of microwave transistor gain and noise coefficients using laser heterodyne methods at the probing of the active area drain- source is shown.

Paper Details

Date Published: 4 March 1999
PDF: 5 pages
Proc. SPIE 3726, Saratov Fall Meeting '98: Light Scattering Technologies for Mechanics, Biomedicine, and Material Science, (4 March 1999); doi: 10.1117/12.341379
Show Author Affiliations
Garif G. Akchurin, Saratov State Univ. (Russia)


Published in SPIE Proceedings Vol. 3726:
Saratov Fall Meeting '98: Light Scattering Technologies for Mechanics, Biomedicine, and Material Science
Valery V. Tuchin; Vladimir P. Ryabukho; Dmitry A. Zimnyakov, Editor(s)

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