Share Email Print
cover

Proceedings Paper

Digital forward error correction in optoelectronic image analysis: a case study
Author(s): Sven Krueger; Stephan Teiwes; Hartmut Gruber; Mathias Senoner; Guenther K.G. Wernicke
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The general advantages of optical filtering methods for real- time image analysis have been extensively discussed in literature. Regarding the applicability of optical filtering for industrial purposes it is important that optical and opto- electronic off-the-shelf components can be used for the production of opto-electronic image processing hardware. However, practical experiences show that such components often do not realize theoretically designed filtering systems in an acceptable manner. Instead, due to their potential imperfection, they can be a source of noise effects and artifacts in filtered images. In optical inspection applications such artefacts can cause false alarms which cannot be tolerated. In this paper we focus on an opto- electronic image analysis system which has been composed using off-the-shelf opto-electronic components. We discuss the setup and its elements. The disturbing effects introduced by these components on the filtered images are demonstrated in a specific application example. Exploiting the fact that the noise effects of the optical components can be recorded, we implemented a digital forward-error-correction that reduces noise in the filtered images drastically. This method is very simple, fast, and efficient. Therefore, it is very useful in the development of opto-electronic image processing hardware for industrial purposes.

Paper Details

Date Published: 9 March 1999
PDF: 8 pages
Proc. SPIE 3715, Optical Pattern Recognition X, (9 March 1999); doi: 10.1117/12.341312
Show Author Affiliations
Sven Krueger, Humboldt-Univ. Berlin (Germany)
Stephan Teiwes, Holographic Design Berlin GbR (Switzerland)
Hartmut Gruber, Humboldt-Univ. Berlin (Germany)
Mathias Senoner, Humboldt-Univ. Berlin (Germany)
Guenther K.G. Wernicke, Humboldt-Univ. Berlin (Germany)


Published in SPIE Proceedings Vol. 3715:
Optical Pattern Recognition X
David P. Casasent; Tien-Hsin Chao, Editor(s)

© SPIE. Terms of Use
Back to Top