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Proceedings Paper

Wavelet-based two-dimensional corner detection
Author(s): Zhan Wang; Fukan Huang; Jianwei Wan
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Paper Abstract

A multi-scale wavelet-based non-parametric algorithm for detecting and locating corners in 2D images is proposed. First using zero-crossing-based 2D edge detector we can get the edge elements, after edge linking and give each planar curve its orientation space representation we can get the orientation curves. Based on the multi-scale wavelet transform of the orientation curves we can utilize the information of local maximum positions to detect and locate the corners. Experimental results with some synthetic and real images show that this algorithm has high precision and stability of the corner detection and location.

Paper Details

Date Published: 9 March 1999
PDF: 8 pages
Proc. SPIE 3715, Optical Pattern Recognition X, (9 March 1999); doi: 10.1117/12.341309
Show Author Affiliations
Zhan Wang, National Univ. of Defense Technology (China)
Fukan Huang, National Univ. of Defense Technology (China)
Jianwei Wan, National Univ. of Defense Technology (China)


Published in SPIE Proceedings Vol. 3715:
Optical Pattern Recognition X
David P. Casasent; Tien-Hsin Chao, Editor(s)

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