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Proceedings Paper

Optical-electronic pattern recognition system based on image-moment-features adaptive computation
Author(s): Veacheslav L. Perju; Adrian V. Gurau; V. V. Perju
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Paper Abstract

The new class of computer systems is presented, the architecture of which is controlled by parameters of the input images and based on usage of the adaptive moment image features (MIF) statistical analysis. Main types of MIF, as well as opportunity of their formation are described.

Paper Details

Date Published: 9 March 1999
PDF: 9 pages
Proc. SPIE 3715, Optical Pattern Recognition X, (9 March 1999); doi: 10.1117/12.341308
Show Author Affiliations
Veacheslav L. Perju, Technical Univ. of Moldova (Moldova)
Adrian V. Gurau, Technical Univ. of Moldova (Moldova)
V. V. Perju, Technical Univ. of Moldova (Moldova)


Published in SPIE Proceedings Vol. 3715:
Optical Pattern Recognition X
David P. Casasent; Tien-Hsin Chao, Editor(s)

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