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Proceedings Paper

Internal standardization and calibration of surface acoustic wave chemical sensor systems
Author(s): Ronald E. Shaffer; Michael T. Cygan; Sean J. Hart; Russell Chung; Viet Q. Nguyen; Dan Dilella; Robert Andrew McGill
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Paper Abstract

Prototype surface acoustic wave chemical sensor systems are described, which can detect and identify toxic vapors in real-time at trace concentrations. To operate autonomously for long periods, without failure, requires a thorough understanding of the hardware and software requirements of the sensor system. The SAWCAD and SAWRHINO prototypes, which implement several improvements to the hardware, over previously developed systems, are described. Software for vapor detection and neural network identification are also discussed. Preliminary results from two new software enhancements are described. Improved chemical discrimination occurs when the response slopes are incorporated into the analysis of the SAW ambient data. The generalized rank annihilation method is shown to be a powerful tool for extracting pure component analyte signatures from trap and purge gas solid chromatographic SAW data.

Paper Details

Date Published: 26 February 1999
PDF: 11 pages
Proc. SPIE 3537, Electro-Optic, Integrated Optic, and Electronic Technologies for Online Chemical Process Monitoring, (26 February 1999); doi: 10.1117/12.341034
Show Author Affiliations
Ronald E. Shaffer, Naval Research Lab. (United States)
Michael T. Cygan, Naval Research Lab. (United States)
Sean J. Hart, Nova Research Inc. and Naval Research Lab. (United States)
Russell Chung, Geo-Centers Inc. and Naval Research Lab. (United States)
Viet Q. Nguyen, Geo-Centers Inc. and Naval Research Lab. (United States)
Dan Dilella, Naval Research Lab. (United States)
Robert Andrew McGill, Naval Research Lab. (United States)


Published in SPIE Proceedings Vol. 3537:
Electro-Optic, Integrated Optic, and Electronic Technologies for Online Chemical Process Monitoring
Mahmoud Fallahi; Mahmoud Fallahi; Robert J. Nordstrom; Terry R. Todd, Editor(s)

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