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Very fast imaging FT spectrometer for online process monitoring and control
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Paper Abstract

Designs & Prototypes has developed a small, very fast, rugged rotary Fourier transform (FT) spectrometer, which can be used in conjunction with fiber optics to monitor industrial processes. When used in an imaging configuration with a mosaic detector array, multiple processes (or multiple locations in a process) can be monitored simultaneously. The rotary scan allows operation without the laser reference of conventional FT spectrometers, and can easily yield scan rates from 30 to more than 300 scans per second. Single pixel operation at 360 scans per second and 1 cm -1 resolution, with excellent lineshape, has been demonstrated. Multiple pixel operation has also been demonstrated using a 3X3 HgCdTe PC mosaic detector. Field testing of a hand portable version with 8 cm-1 resolution will be performed in late summer 1998. The unit can measure spectra in the NIR, SWIR, and Thermal IR, with the appropriate optics and detector sets. The optical bench for 8 cm-1 resolution is 2.5X3.5 inches, and 2.5 inches high. It weighs 11.5 oz., and is totally sealed from the environment. Electrons for servo and detector channel functions can be packaged into an enclosure 6X4X2 inches. For very fast real time processing, single or multiple DSPs can be used. The development work has been supported by contracts from the U.S. Army, a large U.S. aerospace company, and a major Australian mining company.

Paper Details

Date Published: 26 February 1999
PDF: 8 pages
Proc. SPIE 3537, Electro-Optic, Integrated Optic, and Electronic Technologies for Online Chemical Process Monitoring, (26 February 1999); doi: 10.1117/12.341016
Show Author Affiliations
Winthrop Wadsworth, Designs and Prototypes, Ltd. (United States)
Jens-Peter Dybwad, Designs and Prototypes, Ltd. (United States)

Published in SPIE Proceedings Vol. 3537:
Electro-Optic, Integrated Optic, and Electronic Technologies for Online Chemical Process Monitoring
Mahmoud Fallahi; Mahmoud Fallahi; Robert J. Nordstrom; Terry R. Todd, Editor(s)

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