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Proceedings Paper

Direct observation of charge gratings on photorefractive materials using force microscopy
Author(s): W. Krieger; E. Soergel; G. Roesel; Herbert Walther
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Paper Abstract

Light-induced charge gratings on photorefractive materials are investigated using electrostatic force detection with an atomic force microscope. The high sensitivity of the detection method permits - for the first time - the study of charge gratings on very thin photorefractive polymer films (50nm and 80 nm), which cannot be investigated by optical means. Profiles of charge gratings on Bi12SiO20 crystals and on polymer films are observed. In addition, the time development of such profiles during the writing process and the decay is investigated. The excellent lateral resolution of the force measurements leads to the detection of a nanostructure in the charge distribution, which is attributed to surface imperfections and changes in the chemical composition of the materials.

Paper Details

Date Published: 25 February 1999
PDF: 7 pages
Proc. SPIE 3736, ICONO '98: Quantum Optics, Interference Phenomena in Atomic Systems, and High-Precision Measurements, (25 February 1999); doi: 10.1117/12.340148
Show Author Affiliations
W. Krieger, Max-Planck-Institut fuer Quantenoptik (Germany)
E. Soergel, Max-Planck-Institut fuer Quantenoptik (Germany)
G. Roesel, Max-Planck-Institut fuer Quantenoptik (Germany)
Herbert Walther, Max-Planck-Institut fuer Quantenoptik (Germany)

Published in SPIE Proceedings Vol. 3736:
ICONO '98: Quantum Optics, Interference Phenomena in Atomic Systems, and High-Precision Measurements
Anatoli V. Andreev; Sergei N. Bagayev; Anatoliy S. Chirkin; Vladimir I. Denisov, Editor(s)

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