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Proceedings Paper

New approach to optical measurements of small objects with superresolution
Author(s): Vadim P. Veiko; Nikolay B. Voznesensky; Vitaly M. Domnenko; Alexey E. Goussev; Tatyana V. Ivanova; Sergey A. Rodionov
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Paper Abstract

The application of optical superresolution technique to measuring small particles, said to be secondary light sources with various scales of sizes - from micrometers to nanometers, is discussed. The concept of a separate nanosized object and theoretical approach to recognition of its size through the mathematical continuation of the visible angular spectrum of vector plane waves suggested.

Paper Details

Date Published: 25 February 1999
PDF: 10 pages
Proc. SPIE 3736, ICONO '98: Quantum Optics, Interference Phenomena in Atomic Systems, and High-Precision Measurements, (25 February 1999); doi: 10.1117/12.340137
Show Author Affiliations
Vadim P. Veiko, St. Petersburg State Institute of Fine Mechanics and Optics (Russia)
Nikolay B. Voznesensky, St. Petersburg State Institute of Fine Mechanics and Optics (Russia)
Vitaly M. Domnenko, St. Petersburg State Institute of Fine Mechanics and Optics (Russia)
Alexey E. Goussev, St. Petersburg State Institute of Fine Mechanics and Optics (Russia)
Tatyana V. Ivanova, St. Petersburg State Institute of Fine Mechanics and Optics (Russia)
Sergey A. Rodionov, St. Petersburg State Institute of Fine Mechanics and Optics (Russia)


Published in SPIE Proceedings Vol. 3736:
ICONO '98: Quantum Optics, Interference Phenomena in Atomic Systems, and High-Precision Measurements
Anatoli V. Andreev; Sergei N. Bagayev; Anatoliy S. Chirkin; Vladimir I. Denisov, Editor(s)

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