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Proceedings Paper

Portable holographic interferometer for residual stress measurement and nondestructive testing (NDT) of pipelines
Author(s): Yuriy Onishchenko; Anatoli Kniazkov; Jon Shulz; Gregory J. Salamo
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Paper Abstract

Introducing a small scratch (10 - 25 (mu) depth) on the surface of a part containing residual stresses produces a small change in displacements around of the scratch on the surface. When the displacements are measured as a function of the depth of a scratch, a very small depth releases displacements of about (lambda) /10. The present paper shows that introduction of an additional faze shift permits determination of very small displacements and also presents the portable interferometer and the technique for measurement of residual stress in field conditions.

Paper Details

Date Published: 5 February 1999
PDF: 9 pages
Proc. SPIE 3588, Nondestructive Evaluation of Utilities and Pipelines III, (5 February 1999); doi: 10.1117/12.339937
Show Author Affiliations
Yuriy Onishchenko, Univ. of Arkansas (United States)
Anatoli Kniazkov, Univ. of Arkansas (United States)
Jon Shulz, Univ. of Arkansas (United States)
Gregory J. Salamo, Univ. of Arkansas (United States)

Published in SPIE Proceedings Vol. 3588:
Nondestructive Evaluation of Utilities and Pipelines III
Walter G. Reuter, Editor(s)

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