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Proceedings Paper

Enhanced x-ray images using amorphous silicon arrays
Author(s): William F. Hartman; Eric S. Boltz
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Paper Abstract

TPL, in collaboration with Xerox Palo Alto Research Center and Thermotrex, is developing advanced amorphous silicon sensor arrays for primary application to nondestructive evaluation. Amorphous silicon flat panel technology provides unique capabilities which are directly applicable to a number of NDE and process verification applications. Like other digital radiography technologies, amorphous silicon arrays (ASAs) greatly reduce inspection time, materials use and waste products associated with conventional radiographic inspection. Unlike techniques based on charge coupled devices, ASAs also provide a format that is analogous to the use of film; that is direct exposure and large area imaging. This unique combination of traits from both film-like systems and camera-like systems makes ASAs ideal for a wide range of applications. With careful considerations of the advantages and limitations of ASA technology, implementation of high performance, cost-effective inspection systems based on this enabling technology can be achieved. This paper discusses the current state of ASA technology, as well as the potential for ASA technology advances, and presents results pertinent to NDE applications.

Paper Details

Date Published: 8 February 1999
PDF: 8 pages
Proc. SPIE 3585, Nondestructive Evaluation of Aging Materials and Composites III, (8 February 1999); doi: 10.1117/12.339872
Show Author Affiliations
William F. Hartman, TPL, Inc. (United States)
Eric S. Boltz, TPL, Inc. (United States)


Published in SPIE Proceedings Vol. 3585:
Nondestructive Evaluation of Aging Materials and Composites III
George Y. Baaklini; Carol A. Nove; Eric S. Boltz, Editor(s)

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