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Proceedings Paper

High-performance gamma spectroscopy for equipment retrieval from Hanford high-level nuclear waste tanks
Author(s): Gary L. Troyer; K. E. Hillesand; S. G. Goodwin; S. F. Kessler; E. Wayne Killian; D. Legare; Joseph V. Nelson; R. F. Richard; E. M. Nordquist
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Paper Abstract

The cleanup of high level defense nuclear waste at the Hanford site presents several progressive challenges. Among these is the removal and disposal of various components from buried active waste tanks to allow new equipment insertion or hazards mitigation. A unique automated retrieval system at the tank provides for retrieval, high pressure washing, inventory measurement, and containment for disposal. Key to the inventory measurement is a three detector HPGe high performance gamma spectroscopy system capable of recovering data at up to ninety per cent saturation (200,000 counts per second). Data recovery is based on a unique embedded electronic pulser and specialized software to report the inventory. Each of the detectors have different shielding specified through Monte Carlo simulation with the MCNP program. This shielding provides performance over a dynamic range of eight orders of magnitude. System description, calibration issues and operational experiences are discussed.

Paper Details

Date Published: 29 January 1999
PDF: 11 pages
Proc. SPIE 3536, Nuclear Waste Instrumentation Engineering, (29 January 1999); doi: 10.1117/12.339063
Show Author Affiliations
Gary L. Troyer, Numatec Hanford Corp. (United States)
K. E. Hillesand, Fluor Daniel Northwest (United States)
S. G. Goodwin, Lockheed Martin Idaho Technologies Corp. (United States)
S. F. Kessler, Fluor Daniel Northwest (United States)
E. Wayne Killian, Lockheed Martin Idaho Technologies Corp. (United States)
D. Legare, Fluor Daniel Northwest (United States)
Joseph V. Nelson, Fluor Daniel Northwest (United States)
R. F. Richard, Fluor Daniel Northwest (United States)
E. M. Nordquist, Numatec Hanford Co. (United States)

Published in SPIE Proceedings Vol. 3536:
Nuclear Waste Instrumentation Engineering
David E. Robertson, Editor(s)

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