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Proceedings Paper

Photoluminescence and vibrational spectroscopic studies on weathered uranium oxides
Author(s): DeLyle Eastwood; Jeffrey B. Martin; Larry W. Burggraf; Dennis S. Rand; Matthew S. Zickafoose; Dale L. Perry
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Paper Abstract

Spectroscopic studies were performed both on uranium oxides as baseline and on uranium oxides artificially weathered under known laboratory conditions in air, varying humidity, carbon dioxide concentration, temperature and exposure to UV light. Spectroscopic techniques included photoluminescence and diffuse reflectance FTIR. Photoluminescence measurements were made using a Spex Fluorolog-3TM spectrofluorometer with phosphorimeter. FTIR measurements were made using a Bomem MB157 FTIR spectrophotometer with DTGS detector and approximately 450 cm-1 cut-off and a Graseby SelectorTM diffuse reflectance accessory with special cells and diamond dust as diluent and internal standard. Weathered-related reactions involving the uranium oxides that have been studied include oxidation and the formation of hydroxides and carbonates. Data are discussed with respect to both the reactions of the uranium oxides in the study and in context of reaction chemistry and mechanisms that have been previously documented. The results will be discussed in the context of environmental monitoring.

Paper Details

Date Published: 10 February 1999
PDF: 9 pages
Proc. SPIE 3534, Environmental Monitoring and Remediation Technologies, (10 February 1999); doi: 10.1117/12.339031
Show Author Affiliations
DeLyle Eastwood, Air Force Institute of Technology (United States)
Jeffrey B. Martin, Air Force Institute of Technology (United States)
Larry W. Burggraf, Air Force Institute of Technology (United States)
Dennis S. Rand, Air Force Institute of Technology (United States)
Matthew S. Zickafoose, Air Force Institute of Technology (United States)
Dale L. Perry, Lawrence Berkeley National Lab. and Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 3534:
Environmental Monitoring and Remediation Technologies
Tuan Vo-Dinh; Robert L. Spellicy, Editor(s)

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