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Proceedings Paper

Pulsed laser deposition of quantum-sized bismuth films
Author(s): G. Yu. Shubnii; Alexander N. Zherikhin; E. V. Prokopov; A. M. Tskhovrebov; L. N. Zherikhina; V. V. Voronov
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Paper Abstract

Thin bismuth films were deposited by pulsed laser deposition technique. The conductivity of films was measured in-situ during deposition process. Quantum oscillations of conductivity were observed. Films were investigated by photoelectron spectroscopy technique. Red shift of outer work function for about 1.5 eV for thin films was observed.

Paper Details

Date Published: 20 January 1999
PDF: 5 pages
Proc. SPIE 3688, 6th International Conference on Industrial Lasers and Laser Applications '98, (20 January 1999); doi: 10.1117/12.337530
Show Author Affiliations
G. Yu. Shubnii, NICTL Laser Research Ctr. (Russia)
Alexander N. Zherikhin, NICTL Laser Research Ctr. (Russia)
E. V. Prokopov, P.N. Lebedev Physical Institute (Russia)
A. M. Tskhovrebov, P.N. Lebedev Physical Institute (Russia)
L. N. Zherikhina, P.N. Lebedev Physical Institute (Russia)
V. V. Voronov, Institute of General Physics (Russia)


Published in SPIE Proceedings Vol. 3688:
6th International Conference on Industrial Lasers and Laser Applications '98
Vladislav Ya. Panchenko; Vladimir S. Golubev, Editor(s)

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