Share Email Print
cover

Proceedings Paper

End point determination using full-spectrum acquisition and evolving windowed factor analysis
Author(s): Wayne Branagh; Jason Rivers; Robert Fry
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

New research involving determination of endpoint on low open area etches using full spectrum optical emission spectroscopy (OES) will be presented. Traditionally, monochromator based systems have been used to determine endpoint by monitoring one or two strongly emitting wavelengths. For exposed open areas of < 1.0 percent, a more sensitive approach is required for the next generation of chips. Array detectors can provide a wealth of spectral information from a variety of gas phase emitting species, which can potentially each make a contribution to the endpoint signal. Evolving windowed factor analysis (EWFA) processes al of this spectral information into a single eigenvector output representing overall variance, which is used to call endpoint. The eigenvector output, which is influenced by all spectral emissions, is more responsive to the endpoint condition than one or two individual wavelengths. EWFA results form low exposed open area studies will be presented.

Paper Details

Date Published: 22 January 1999
PDF: 7 pages
Proc. SPIE 3535, Advanced Sensors and Monitors for Process Industries and the Environment, (22 January 1999); doi: 10.1117/12.337479
Show Author Affiliations
Wayne Branagh, CETAC Technologies Inc. (United States)
Jason Rivers, CETAC Technologies Inc. (United States)
Robert Fry, CETAC Technologies Inc. (United States)


Published in SPIE Proceedings Vol. 3535:
Advanced Sensors and Monitors for Process Industries and the Environment
Wim A. de Groot, Editor(s)

© SPIE. Terms of Use
Back to Top