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Proceedings Paper

Quantitative evaluation of photoplethysmographic artifact reduction for pulse oximetry
Author(s): Matthew J. Hayes; Peter Richard Smith
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Paper Abstract

Motion artefact corruption of pulse oximeter output, causing both measurement inaccuracies and false alarm conditions, is a primary restriction in the current clinical practice and future applications of this useful technique. Artefact reduction in photoplethysmography (PPG), and therefore by application in pulse oximetry, is demonstrated using a novel non-linear methodology recently proposed by the authors. The significance of these processed PPG signals for pulse oximetry measurement is discussed, with particular attention to the normalization inherent in the artefact reduction process. Quantitative experimental investigation of the performance of PPG artefact reduction is then utilized to evaluate this technology for application to pulse oximetry. While the successfully demonstrated reduction of severe artefacts may widen the applicability of all PPG technologies and decrease the occurrence of pulse oximeter false alarms, the observed reduction of slight artefacts suggests that many such effects may go unnoticed in clinical practice. The signal processing and output averaging used in most commercial oximeters can incorporate these artefact errors into the output, while masking the true PPG signal corruption. It is therefore suggested that PPG artefact reduction should be incorporated into conventional pulse oximetry measurement, even in the absence of end-user artefact problems.

Paper Details

Date Published: 15 January 1999
PDF: 10 pages
Proc. SPIE 3570, Biomedical Sensors, Fibers, and Optical Delivery Systems, (15 January 1999); doi: 10.1117/12.336924
Show Author Affiliations
Matthew J. Hayes, Loughborough Univ. (United Kingdom)
Peter Richard Smith, Loughborough Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 3570:
Biomedical Sensors, Fibers, and Optical Delivery Systems
Francesco Baldini; Nathan I. Croitoru; Martin Frenz; Ingemar Lundstroem; Mitsunobu Miyagi; Riccardo Pratesi; Otto S. Wolfbeis, Editor(s)

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