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Proceedings Paper

Laterally modulated excitation microscopy: improvement of resolution by using a diffraction grating
Author(s): Rainer Heintzmann; Christoph G. Cremer
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Paper Abstract

High spatial frequencies in the illuminating light of microscopes lead to a shift of the object spatial frequencies detectable through the objective lens. If a suitable procedure is found for evaluation of the measured data, a microscopic image with a higher resolution than under flat illumination can be obtained. A simple method for generation of a laterally modulated illumination pattern is discussed here. A specially constructed diffraction grating was inserted in the illumination beam path at the conjugate object plane (position of the adjustable aperture) and projected through the objective into the object. Microscopic beads were imaged with this method and evaluated with an algorithm based on the structure of the Fourier space. The results indicate an improvement of resolution.

Paper Details

Date Published: 19 January 1999
PDF: 12 pages
Proc. SPIE 3568, Optical Biopsies and Microscopic Techniques III, (19 January 1999); doi: 10.1117/12.336833
Show Author Affiliations
Rainer Heintzmann, Univ. of Heidelberg (Germany)
Christoph G. Cremer, Univ. of Heidelberg (Germany)


Published in SPIE Proceedings Vol. 3568:
Optical Biopsies and Microscopic Techniques III
Irving J. Bigio; Herbert Schneckenburger; Jan Slavik; Katarina Svanberg; Pierre M. Viallet, Editor(s)

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