Share Email Print
cover

Proceedings Paper

Local determination of the terminating layer of SrTiO3
Author(s): J. Fompeyrine; R. Berger; Christoph Gerber; Joel Perret; Jeongwoo Seo; Jean-Pierre Locquet
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The crystallinity and physical properties of complex oxide films are strongly influenced by the quality of the substrate. This is determined by the bulk microstructure (e.g. grains, twin boundaries, vacancies) and by the surface characteristics. In the case of single-crystal films grown on single-crystal substrates, the latter point becomes extremely important and has to be studied in detail at the nanometer scale. In the case of SrTiO3 (001) substrates, the fabrication process usually leads to samples with different surfaces. The topography itself is very sensitive to process parameters, and has exhaustively been studied in the past few years. The terminating layer can be a mixture of both SrO and TiO2 planes. Only few techniques can determine this surface chemical composition, and so far only on a macroscopic scale. We report here, for the first time, the chemical characterization of such a surface, for which we use a combination of annealing and scanning probe microscopy. We then applied the same technique to the characterization of the surface LaAlO3 (001) and SrLaAlO4 (001) substrates. So far, no friction contrast has been observed on these latter surfaces. In the case of LaAlO3, the characteristic twin structure is clearly revealed.

Paper Details

Date Published: 22 December 1998
PDF: 6 pages
Proc. SPIE 3481, Superconducting and Related Oxides: Physics and Nanoengineering III, (22 December 1998); doi: 10.1117/12.335887
Show Author Affiliations
J. Fompeyrine, IBM Zurich Research Lab. (Switzerland)
R. Berger, IBM Zurich Research Lab. and Univ. of Basel (Switzerland)
Christoph Gerber, IBM Zurich Research Lab. (Switzerland)
Joel Perret, IBM Zurich Research Lab. and Univ. de Neuchatel (Switzerland)
Jeongwoo Seo, IBM Zurich Research Lab. and Univ. de Neuchatel (South Korea)
Jean-Pierre Locquet, IBM Zurich Research Lab. (Switzerland)


Published in SPIE Proceedings Vol. 3481:
Superconducting and Related Oxides: Physics and Nanoengineering III
Davor Pavuna; Ivan Bozovic, Editor(s)

© SPIE. Terms of Use
Back to Top