Share Email Print
cover

Proceedings Paper

Absolute sapphire optical fiber interferometric sensors
Author(s): Hai Xiao; Y. Xie; Jiangdong Deng; Russell G. May; Anbo Wang
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Sapphire optical fiber sensor are greatly promising for high temperature sensing applications because of their high melting point, which exceeds 2000 degrees C. The extrinsic Fabry-Perot interferometric (EFPI) sapphire fiber sensors, based on absolute white light spectrum scanning signal processing, are extremely attractive in engineering applications because they do not require initialization and/or calibration when the system is turned on. Furthermore, it is not necessary to operate them in linear regions to avoid nonlinear effects, a significant problem in other EFPI sensor. In this paper, we use a single-crystal sapphire fiber for making an EFPI sensor. Interference fringes were observed by using both laser and light emitting diode sources. The effect of the lead-in fiber diameter on fringe visibility is also discussed.

Paper Details

Date Published: 11 January 1999
PDF: 7 pages
Proc. SPIE 3538, Process Monitoring with Optical Fibers and Harsh Environment Sensors, (11 January 1999); doi: 10.1117/12.335736
Show Author Affiliations
Hai Xiao, Virginia Polytechnic Institute and State Univ. (United States)
Y. Xie, Virginia Polytechnic Institute and State Univ. (United States)
Jiangdong Deng, Virginia Polytechnic Institute and State Univ. (United States)
Russell G. May, Virginia Polytechnic Institute and State Univ. (United States)
Anbo Wang, Virginia Polytechnic Institute and State Univ. (United States)


Published in SPIE Proceedings Vol. 3538:
Process Monitoring with Optical Fibers and Harsh Environment Sensors
Michael A. Marcus; Michael A. Marcus; Anbo Wang, Editor(s)

© SPIE. Terms of Use
Back to Top