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Proceedings Paper

Relationship between uncertainty in reflectance factor data and computed CIELAB values: some intuitive tools
Author(s): David Q. McDowell
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Paper Abstract

The use of colorimetric data is increasing exponentially in all area of image technology. This is being driven by both the availability of moderately priced instrumentation that makes acquisition of this type of data economically feasible, and by the increase in computing power that allows images to be processed and transformed using colorimetric tools. Too often the people using colorimetric data, to create color management profiles or other transforms, have little experience in either making spectral reflectance measurements or in computing the colorimetric parameters that are based on these measurements. In addition, although many people working in either graphic arts or photography have an intuitive understanding of process variation expressed in terms of density, few have extrapolated this understanding into colorimetry. This paper will discuss typical levels of uncertainty in measurement of spectral reflectance factor and the associated uncertainty in CIELAB values computed from these data. It will also provide some typical relationships between status density and colorimetry. Included are some generalized relationships that can be used as intuitive guides to assist users in evaluating the significance of colorimetric differences reported in terms of CIE delta-E.

Paper Details

Date Published: 22 December 1998
PDF: 3 pages
Proc. SPIE 3648, Color Imaging: Device-Independent Color, Color Hardcopy, and Graphic Arts IV, (22 December 1998); doi: 10.1117/12.334568
Show Author Affiliations
David Q. McDowell, Eastman Kodak Co. (United States)


Published in SPIE Proceedings Vol. 3648:
Color Imaging: Device-Independent Color, Color Hardcopy, and Graphic Arts IV
Giordano B. Beretta; Reiner Eschbach, Editor(s)

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