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Proceedings Paper

Static secondary ion mass spectrometry characterization of nail polish and paint surfaces
Author(s): Garold L. Gresham; Gary S. Groenewold; William F. Bauer; Jani C. Ingram; Recep Avci
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Paper Abstract

A variety of paint and fingernail polish samples, which were visually similar, but had different chemical compositions, were analyzed using three static secondary ion mass spectrometry (SIMS) techniques. These techniques included: (1) high spatial resolution/high mass resolution imaging time-of-flight SIMS; (2) analysis of stabilized high mass secondary ions with an ion trap SIMS capable of MS/MS; (3) qualitative characterization using a quadrupole SIMS with `pulsed extraction' charge compensation. In some cases, distinguishing between different coatings was easily achieved because of the presence of dominant ions derived from the components of the coating materials in the SIMS spectra. In other instances, coating distinction was difficult within a product group because of spectral complexity; for this reason, multivariate statistical techniques were employed, which allowed meaningful classification of spectra. Partial Least Squares and Principle Component Analysis were applied to quadrupole SIMS data. When using Partial Least Squares analysis reasonably accurate coating identification was achieved with the preliminary data with overall correct identifications at greater than 90% sensitivity.

Paper Details

Date Published: 4 February 1999
PDF: 7 pages
Proc. SPIE 3576, Investigation and Forensic Science Technologies, (4 February 1999); doi: 10.1117/12.334516
Show Author Affiliations
Garold L. Gresham, Idaho National Engineering and Environmental Lab. (United States)
Gary S. Groenewold, Idaho National Engineering and Environmental Lab. (United States)
William F. Bauer, Idaho National Engineering and Environmental Lab. (United States)
Jani C. Ingram, Idaho National Engineering and Environmental Lab. (United States)
Recep Avci, Montana State Univ. (United States)


Published in SPIE Proceedings Vol. 3576:
Investigation and Forensic Science Technologies
Kathleen Higgins, Editor(s)

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