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Proceedings Paper

Speckle-induced phase error in laser-based phase-shifting projected-fringe profilometry
Author(s): Hongyu Liu; Guowen Lu; Jonathan Jones; Daniel Komisarek; Shudong Wu
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Paper Abstract

Although laser sources offer more advantages over white light sources in some phase-shifting projected fringe profilometry applications, these advantages are at the cost of speckle. This paper presents some basic statistics of the speckle-induced phase measurement errors that are investigated based on the multiplicative-noise model for image-plane speckles. The dependence of the phase error distribution and measurement uncertainty on the speckle size and grating pitch is found based on the Karhunen-Loeve expansion of speckle field. This analysis shows that phase errors caused by speckles can be modeled as additive white Gaussian noise. Based on these simulation results we can discuss the designs of the optical system and noise reduction algorithms.

Paper Details

Date Published: 29 December 1998
PDF: 12 pages
Proc. SPIE 3520, Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (29 December 1998); doi: 10.1117/12.334351
Show Author Affiliations
Hongyu Liu, The Pennsylvania State Univ. (United States)
Guowen Lu, The Pennsylvania State Univ. (United States)
Jonathan Jones, The Pennsylvania State Univ. (United States)
Daniel Komisarek, The Pennsylvania State Univ. (United States)
Shudong Wu, The Pennsylvania State Univ. (United States)


Published in SPIE Proceedings Vol. 3520:
Three-Dimensional Imaging, Optical Metrology, and Inspection IV
Kevin G. Harding; Donald J. Svetkoff; Katherine Creath; James S. Harris, Editor(s)

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