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Proceedings Paper

Mach-Zehnder interferometer fringe projector for variable-resolution video moire
Author(s): Phillip C. Kalmanson; August Schutte; Chris L. Hart; Joel H. Blatt
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Paper Abstract

A Mach-Zehnder based variable resolution fringe projection system has been built for 3D video moire machine vision. This system uses the three main advantages of the Mach- Zehnder - 1) There is no optical feedback to the laser source; 2) The interferometer can accept two different laser wavelengths simultaneously; and 3) The interferometer produces two orthogonal output beams. The lack of optical feedback makes the Mach-Zehnder especially attractive for use with high power laser diode sources which are sensitive to optical feedback. When the two input ports are used with two different wavelength laser, the target can be illuminated by simultaneous projection of two different sets of colored fringes with two different spatial frequencies. This can allow more reliable reconstruction of the 3D surface over discontinuous jumps. Finally, the lack of feedback to the source coupled with the dual outputs means that he Mach-Zehnder fringe projector is very efficient in that 100 percent of the laser light is projected onto the prime and reference targets. Setup and alignment of this interferometer will be discussed for both parallel and diverging light. Plots of fringe visibility will be given for both outputs and both inputs.Application to a video moire based real time 3D error map machine vision system will be discussed.

Paper Details

Date Published: 29 December 1998
PDF: 6 pages
Proc. SPIE 3520, Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (29 December 1998); doi: 10.1117/12.334342
Show Author Affiliations
Phillip C. Kalmanson, Florida Institute of Technology (United States)
August Schutte, Florida Institute of Technology (United States)
Chris L. Hart, Florida Institute of Technology (United States)
Joel H. Blatt, Florida Institute of Technology (United States)


Published in SPIE Proceedings Vol. 3520:
Three-Dimensional Imaging, Optical Metrology, and Inspection IV
Kevin G. Harding; Donald J. Svetkoff; Katherine Creath; James S. Harris, Editor(s)

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