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Proceedings Paper

Precision determination of pion mass using x-ray CCD spectroscopy
Author(s): D. F. Anagnostopoulos; M. Augsburger; Gunther L. Borchert; D. Chatellard; Michael Mace Daum; J.-P. Egger; Detlev Gotta; P. Hauser; P. Indelicato; E. Jeannet; K. Kirch; Nick Nelms; O. W. Schult; T. Siems; Leopold M. Simons; Alan A. Wells
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Paper Abstract

An experiment is described which aims to determine the pion mass to 1 ppm or better, from which a new determination of the upper limit of the muon neutrino mass is anticipated. The approach utilizes spectroscopy of X-ray emissions from pionic atoms formed in gaseous targets. The spectroscopy is performed with a Bragg crystal spectrometer, with an energy resolution of approximately 300 meV, using an array of X-ray CCDs mounted at the focus to measure the spectral line structure of the 4 keV pionic nitrogen transition. To achieve sub-ppm accuracy, as energy calibration a muonic oxygen transition is used. It is known with a precision of 0.3 ppm and almost coincides in energy with the pionic transition.

Paper Details

Date Published: 17 December 1998
PDF: 7 pages
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, (17 December 1998); doi: 10.1117/12.333618
Show Author Affiliations
D. F. Anagnostopoulos, Institut fuer Kernphysik (Germany)
M. Augsburger, Univ. de Neuchatel (Switzerland)
Gunther L. Borchert, Institut fuer Kernphysik (Germany)
D. Chatellard, Univ. de Neuchatel (Switzerland)
Michael Mace Daum, United States Navy (United States)
J.-P. Egger, Univ. de Neuchatel (Switzerland)
Detlev Gotta, Institut fuer Kernphysik (Germany)
P. Hauser, Paul-Scherrer-Institut (Switzerland)
P. Indelicato, Univ. Pierre et Marie Curie (France)
E. Jeannet, Univ. de Nuechatel (Switzerland)
K. Kirch, Paul-Scherrer-Institut (Switzerland)
Nick Nelms, Univ. of Leicester (United Kingdom)
O. W. Schult, Institut fuer Kernphysik (Germany)
T. Siems, Institut fuer Kernphysik (Germany)
Leopold M. Simons, Paul-Scherrer-Institut (Switzerland)
Alan A. Wells, Univ. of Leicester (United Kingdom)

Published in SPIE Proceedings Vol. 3443:
X-Ray and Ultraviolet Spectroscopy and Polarimetry II
Silvano Fineschi, Editor(s)

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