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Proceedings Paper

EUV and x-ray instrumentation for spectrometry, polarimetry, and imaging in hot plasma diagnostics, atomic physics, and x-ray microscopy: a status report
Author(s): Victor L. Kantsyrev; Bruno S. Bauer; Ronald A. Phaneuf
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Paper Abstract

The Instrumentation Program at Physics Department of the University of Nevada, Reno, USA is based on results of the development and study of one of first glass capillary optics devices in period from 1974 to earlier 90s in USSR/Russia (by V. Kantsyrev, O. Ananyin, Yu. Bykovsky and collaborators). The main direction of our program is the development of several techniques for extreme ultraviolet, soft x-ray and x-ray optical instrumentation, for spectroscopic diagnostics of hot plasmas, spectroscopic studies of interaction of multicharged ion beams with matter, biomedical x-ray microscopy. Our currently-developed instruments include: EUV polarimeter/spectrometer with GCC polarizing and focusing elements; a high resolution, a high-sensitivity EUV and x-ray spectrometer with focusing GCC, that also serves as a high- transmission window for differential vacuum pumping; a prototype of new multiband, two dimensional EUV and x-ray imaging spectrometer for plasma diagnostics; a pinhole camera with GCC using as a hard x-ray filter; a soft x-ray spectrograph with MLM for plasma diagnostics.

Paper Details

Date Published: 17 December 1998
PDF: 12 pages
Proc. SPIE 3443, X-Ray and Ultraviolet Spectroscopy and Polarimetry II, (17 December 1998); doi: 10.1117/12.333602
Show Author Affiliations
Victor L. Kantsyrev, Univ. of Nevada/Reno (United States)
Bruno S. Bauer, Univ. of Nevada/Reno (United States)
Ronald A. Phaneuf, Univ. of Nevada/Reno (United States)


Published in SPIE Proceedings Vol. 3443:
X-Ray and Ultraviolet Spectroscopy and Polarimetry II
Silvano Fineschi, Editor(s)

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