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Proceedings Paper

LWM 200 CD metrology tool evaluation
Author(s): Robert Uitz; John M. Whittey
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Paper Abstract

Metrology tool performance may be based on a number of different factors. Areas such as ease of use, user interface, throughput, long and short term precision, sub-micron linearity, and accuracy are features which may be evaluated. Some areas are subjective and not easily quantifiable. This paper is concerned with evaluating and measuring the areas which are quantifiable such as the tool's 'Gauge R&R' (reproducibility and repeatability), measurement time, long term precision, and reliability. Explanations of the measurement evaluation methods will be presented along with performance data that is indicative of the system's performance.

Paper Details

Date Published: 18 December 1998
PDF: 8 pages
Proc. SPIE 3546, 18th Annual BACUS Symposium on Photomask Technology and Management, (18 December 1998); doi: 10.1117/12.332821
Show Author Affiliations
Robert Uitz, Photronics, Inc. (United States)
John M. Whittey, Leica Microsystems Inc. (United States)

Published in SPIE Proceedings Vol. 3546:
18th Annual BACUS Symposium on Photomask Technology and Management
Brian J. Grenon; Frank E. Abboud, Editor(s)

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