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Proceedings Paper

Recent diamond single-crystal x-ray optics developments at the European Synchrotron Radiation Facility
Author(s): Andreas K. Freund; Jacques P.F. Sellschop; Konrad Lieb; Sylvain Rony; Clemens Schulze-Briese; Leif-Eric Schroeder; Jeremie Teyssier
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Paper Abstract

In an effort to provide synchrotron x-ray beamlines with improved monochromators, a new series of 111-oriented diamond crystals up to 50 mm2 large with thicknesses ranging from 67 micrometer to 175 micrometer was prepared, tested and found to be of very high quality. One sample appeared to be without any defects. Some linear defects were observed by topography on the other samples but without any consequences for the rocking curve width, except for one sample that revealed some mosaicity in part of its volume and could serve as variable flux/resolution monochromator. The rocking curve width exceeded sometimes the theoretical perfect crystal value by a couple of arcsec. Peak and integrated reflectivities were observed to be very close to the theoretical values for a perfect diamond crystal. For the first time, a diamond crystal was elastically bent to achieve sagittal focusing. Although the bending was not absolutely uniform, a spot size of 1 micrometer and gain factors exceeding one order of magnitude were obtained. These results showed that dispersion-free diamond double crystal monochromators of the classical type can be made.

Paper Details

Date Published: 11 December 1998
PDF: 11 pages
Proc. SPIE 3448, Crystal and Multilayer Optics, (11 December 1998); doi: 10.1117/12.332529
Show Author Affiliations
Andreas K. Freund, European Synchrotron Radiation Facility (France)
Jacques P.F. Sellschop, Univ. of the Witwatersrand (South Africa)
Konrad Lieb, European Synchrotron Radiation Facility (France)
Sylvain Rony, European Synchrotron Radiation Facility (France)
Clemens Schulze-Briese, Paul Scherrer Institute (Switzerland)
Leif-Eric Schroeder, European Synchrotron Radiation Facility (Germany)
Jeremie Teyssier, European Synchrotron Radiation Facility (France)

Published in SPIE Proceedings Vol. 3448:
Crystal and Multilayer Optics
Albert T. Macrander; Andreas K. Freund; Tetsuya Ishikawa; Dennis M. Mills, Editor(s)

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