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Proceedings Paper

Multistepped x-ray crystal diffractor based on a pseudospherical geometry
Author(s): Augusto Marcelli; M. I. Mazuritsky; Alexander V. Soldatov
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Paper Abstract

A new type of x-ray focusing crystal diffractor based on a pseudo-spherical stepped geometry is presented. This device is a particular stepped surface, where each element is a spherically bent rectangular crystal, whose reflecting planes are parallel to the surface and oriented so as to fulfill the Bragg condition. The area of each surface element (step) is chosen such as to define the same solid angle. Theoretical parameters and performances of a high resolution Multi-Stepped Monochromator (MSM) based on this geometry are estimated for some typical applications. To this aim, an original approach that allows to determine the Bragg reflection area of each element has been developed and applied both to spherical and pseudo-spherical diffractors. The calculations indicate that the gain of the proposed optical design is significantly enhanced as compared to the best crystal devices bi- dimensionally focusing. In particular in the high resolution conditions, the gain in spectral throughput of a MSM device is about one order of magnitude, with respect a conventional one.

Paper Details

Date Published: 11 December 1998
PDF: 8 pages
Proc. SPIE 3448, Crystal and Multilayer Optics, (11 December 1998); doi: 10.1117/12.332508
Show Author Affiliations
Augusto Marcelli, Istituto Nazionale di Fisica Nucleare (Italy)
M. I. Mazuritsky, Rostov Univ. (Russia)
Alexander V. Soldatov, Rostov Univ. (Russia)


Published in SPIE Proceedings Vol. 3448:
Crystal and Multilayer Optics
Albert T. Macrander; Andreas K. Freund; Tetsuya Ishikawa; Dennis M. Mills, Editor(s)

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