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Proceedings Paper

Determination of coherent strain field in periodic and self-assembled microstructures on crystal surfaces
Author(s): Qun Shen; Stefan Kycia
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Paper Abstract

It is shown that high-resolution x-ray diffraction analyses on coherent thin-film microstructures on crystal surfaces can reveal a variety of information on interfacial strain fields. Diffraction features that can be observed include diffuse interference fringes, asymmetric grating diffraction patterns, and asymmetric crystal-truncation-rod profiles due to the strain-varying regions in a microstructure. From these diffraction features, both the longitudinal and the transverse strain gradients can be determined, in addition to the average elastic strain-tensor components.

Paper Details

Date Published: 11 December 1998
PDF: 6 pages
Proc. SPIE 3448, Crystal and Multilayer Optics, (11 December 1998); doi: 10.1117/12.332498
Show Author Affiliations
Qun Shen, Cornell Univ. (United States)
Stefan Kycia, Cornell Univ. (United States)

Published in SPIE Proceedings Vol. 3448:
Crystal and Multilayer Optics
Albert T. Macrander; Andreas K. Freund; Tetsuya Ishikawa; Dennis M. Mills, Editor(s)

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