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Proceedings Paper

Influence of the characteristics of ESRF x-ray beams on diffraction in a perfect crystal
Author(s): V. Mocella; Jean-Pierre Guigay; Yves P. Epelboin; Andreas K. Freund
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Paper Abstract

On a beam line of a third generation synchrotron facility, such as the ESRF, the small source size of the source and the large distance from the source to the sample are responsible for the remarkable coherence properties of the beam at the sample position. In Bragg diffraction by a perfect crystal, the incident beam is to be considered as a coherent spherical wave, with angular aperture larger than the angular reflection range of the crystal. We show theoretically that, in such condition, the intensity profile of a Bragg diffraction topograph, in transmission geometry (Laue case), should reproduce the angular Bragg reflection profile (rocking curve) of the crystal. We discuss the conditions to be fulfilled concerning the wavelength dispersion of the incident beam. An experimental verification of the theoretical prediction is presented.

Paper Details

Date Published: 11 December 1998
PDF: 6 pages
Proc. SPIE 3448, Crystal and Multilayer Optics, (11 December 1998); doi: 10.1117/12.332497
Show Author Affiliations
V. Mocella, European Synchrotron Radiation Facility (France)
Jean-Pierre Guigay, European Synchrotron Radiation Facility (France)
Yves P. Epelboin, Univ. de Paris VI--Pierre et Marie Curie (France)
Andreas K. Freund, European Synchrotron Radiation Facility (France)


Published in SPIE Proceedings Vol. 3448:
Crystal and Multilayer Optics
Albert T. Macrander; Andreas K. Freund; Tetsuya Ishikawa; Dennis M. Mills, Editor(s)

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