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Proceedings Paper

X-ray scattering applications using pulsed x-ray sources
Author(s): Bennett C. Larson
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Paper Abstract

Pulsed x-ray sources have been used in transient structural phenomena investigations for over fifty years; however, until the advent of synchrotron sources and the development of table-top picosecond lasers, general access to high temporal resolution x-ray diffraction was relatively limited. Advances in diffraction techniques, sample excitation schemes, and detector systems, in addition to increased access to pulsed sources, have led to what is now a diverse and growing array of pulsed-source measurement applications. A survey of time- resolved investigations using pulsed x-ray sources is presented and research opportunities using both present and planned pulsed x-ray sources are discussed.

Paper Details

Date Published: 1 December 1998
PDF: 12 pages
Proc. SPIE 3451, Time Structure of X-Ray Sources and Its Applications, (1 December 1998); doi: 10.1117/12.331844
Show Author Affiliations
Bennett C. Larson, Oak Ridge National Lab. (United States)

Published in SPIE Proceedings Vol. 3451:
Time Structure of X-Ray Sources and Its Applications
Andreas K. Freund; Henry P. Freund; Malcolm R. Howells, Editor(s)

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