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Proceedings Paper

Characterization of graded d-spacing multilayers for hard x-ray telescopes
Author(s): Adrian Ivan; Suzanne E. Romaine; Ricardo J. Bruni; John E. Everett; Paul Gorenstein
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Paper Abstract

The Multilayer Facility at the Center for Astrophysics is involved in developing graded-d spacing multilayers for coating X-ray optics for hard x-ray focusing telescopes. Graded d spacing W/C multilayers have been fabricated on flat substrates of silicon and characterized using specular x-ray reflectivity, AFM, and TEM. Results are presented and compared with theoretical models.

Paper Details

Date Published: 19 November 1998
PDF: 8 pages
Proc. SPIE 3444, X-Ray Optics, Instruments, and Missions, (19 November 1998); doi: 10.1117/12.331276
Show Author Affiliations
Adrian Ivan, Harvard-Smithsonian Ctr. for Astrophysics and Massachusetts Institute of Technology (United States)
Suzanne E. Romaine, Harvard-Smithsonian Ctr. for Astrophysics and Radcliffe College (United States)
Ricardo J. Bruni, Harvard-Smithsonian Ctr. for Astrophysics (United States)
John E. Everett, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Paul Gorenstein, Harvard-Smithsonian Ctr. for Astrophysics (United States)


Published in SPIE Proceedings Vol. 3444:
X-Ray Optics, Instruments, and Missions
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

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