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Proceedings Paper

Calibration results for the AXAF flight contamination monitor
Author(s): Ronald F. Elsner; Stephen L. O'Dell; Brian D. Ramsey; Allyn F. Tennant; Martin C. Weisskopf; Jeffery J. Kolodziejczak; Douglas A. Swartz; Darell E. Engelhaupt; Gordon P. Garmire; John A. Nousek; Mark W. Bautz; Terrance J. Gaetz; Ping Zhao
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Paper Abstract

The Advanced X-ray Astrophysics Facility (AXAF) ground calibration program, easily the most extensive in the history of high energy astrophysics, requires careful attention to the verification of its validity for on-orbit operations of the observatory. The purpose of the Flight Contamination Monitor (FCM) is to verify the transfer of the AXAF absolute flux scale calibration from ground to on-orbit operations and to measure or bound any changes in molecular contamination on the AXAF mirrors. This paper reports the current status of the analysis of FCM measurements taken during ground calibration. The FCM measurements during the AXAF activation phase will be the first look at the on-orbit AXAF performance.

Paper Details

Date Published: 19 November 1998
PDF: 12 pages
Proc. SPIE 3444, X-Ray Optics, Instruments, and Missions, (19 November 1998); doi: 10.1117/12.331235
Show Author Affiliations
Ronald F. Elsner, NASA Marshall Space Flight Ctr. (United States)
Stephen L. O'Dell, NASA Marshall Space Flight Ctr. (United States)
Brian D. Ramsey, NASA Marshall Space Flight Ctr. (United States)
Allyn F. Tennant, NASA Marshall Space Flight Ctr. (United States)
Martin C. Weisskopf, NASA Marshall Space Flight Ctr. (United States)
Jeffery J. Kolodziejczak, Universities' Space Research Association (United States)
Douglas A. Swartz, Universities' Space Research Association (United States)
Darell E. Engelhaupt, Univ. of Alabama in Huntsville (United States)
Gordon P. Garmire, The Pennsylvania State Univ. (United States)
John A. Nousek, The Pennsylvania State Univ. (United States)
Mark W. Bautz, Massachusetts Institute of Technology (United States)
Terrance J. Gaetz, Smithsonian Astrophysical Observatory (United States)
Ping Zhao, Smithsonian Astrophysical Observatory (United States)


Published in SPIE Proceedings Vol. 3444:
X-Ray Optics, Instruments, and Missions
Richard B. Hoover; Arthur B. C. Walker, Editor(s)

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