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Proceedings Paper

Resonant measurement techniques using backward wave oscillators
Author(s): William H. Henderson; George Gruner
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Paper Abstract

We discuss two types of resonant techniques for measuring the electrodynamic properties of conductors in the millimeter and sub-millimeter wave spectral ranges. Using a series of backward wave oscillator sources, we can obtain essentially complete coverage of the frequency range 30 - 1000 GHz. At 100 GHz and below, cylindrical cavity resonators operating the in their TE011 mode are employed to measure both components of the complex surface impedance of bulk samples. Above approximately 100 GHz, a Fabry-Perot resonator, consisting of a sapphire plate with a conducting sample placed against one side, is used. Both thin film and bulk samples may be measured with this technique. We focus on measurement on thin film samples, where the complex conductivity can be obtained directly from the transmission spectra.

Paper Details

Date Published: 13 November 1998
PDF: 9 pages
Proc. SPIE 3465, Millimeter and Submillimeter Waves IV, (13 November 1998); doi: 10.1117/12.331168
Show Author Affiliations
William H. Henderson, Univ. of California/Los Angeles (United States)
George Gruner, Univ. of California/Los Angeles (United States)


Published in SPIE Proceedings Vol. 3465:
Millimeter and Submillimeter Waves IV
Mohammed N. Afsar, Editor(s)

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