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Proceedings Paper

Complex analysis in 3D of the generic arbitrary bilateral fin lines
Author(s): Humberto Cesar Chaves Fernandes; Jarbas de Albuquerque Sales Neto
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Paper Abstract

An electromagnetic application is developed to obtain the effective dielectric constant, the attenuation constant and the characteristic impedance of the arbitrary bilateral fin lines with semiconductor substrate and conductor thickness, simultaneity at the first time. Also the concise Transverse Transmission Line -- TTL full wave method is used, in the analysis. New results of the complex propagation and of the characteristic impedance as function of the frequency and different dimensions and conductivity of the substrate, are obtained in 3-D.

Paper Details

Date Published: 13 November 1998
PDF: 6 pages
Proc. SPIE 3465, Millimeter and Submillimeter Waves IV, (13 November 1998); doi: 10.1117/12.331161
Show Author Affiliations
Humberto Cesar Chaves Fernandes, Federal Univ. of Rio Grande do Norte (Brazil)
Jarbas de Albuquerque Sales Neto, Federal Univ. of Rio Grande do Norte (Brazil)


Published in SPIE Proceedings Vol. 3465:
Millimeter and Submillimeter Waves IV
Mohammed N. Afsar, Editor(s)

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