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Proceedings Paper

Polarization changing and beam profile deformation effects of acousto-optics
Author(s): Chen-Wen Tarn
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Paper Abstract

A spatial Fourier transform approach is proposed to investigate the polarization changing and beam profiles deformation of light during the acoustooptic (AO) interaction in isotropic media. In this paper we consider two basic types of sound waves, namely, the longitudinal and shear waves to be interacted with the light in two interaction regimes, viz. the Bragg and Raman-Nath regimes. The perturbation of the permittivity is then caused by these kinds of acoustic waves and can be expressed in tensor forms. The evolution of different orders scattered light under the Bragg and Raman-Nath conditions can be properly described by a set of equations which are derived from the wave equation using a spatial Fourier transform approach. The solutions explicitly comprise the effects of the polarization changing, beam deformation, and propagational diffraction. It is shown that the spatial beam profiles of the scattered light is distorted during the process due to the effects the AO interaction and propagational diffraction. For both the cases of the longitudinal and shear sound waves, the degree of the profile deformation can be controlled by the changing the amplitude and frequency of the sound. It is also shown that the polarization states of the scattered light are different from the input light due to the AO effect. The degree of difference of the polarization states which depend on the propagation type, frequency, and amplitude of the sound wave can be examined through the use of two polarization parameters, the ellipticity and orientation of the major axis of the scattered light.

Paper Details

Date Published: 11 November 1998
PDF: 10 pages
Proc. SPIE 3581, Acousto-Optics and Applications III, (11 November 1998); doi: 10.1117/12.330510
Show Author Affiliations
Chen-Wen Tarn, National Taiwan Univ. of Science and Technology (Taiwan)


Published in SPIE Proceedings Vol. 3581:
Acousto-Optics and Applications III
Antoni Sliwinski; Bogumil B. J. Linde; Piotr Kwiek, Editor(s)

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