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Proceedings Paper

Implementation of the wavelet transform for V(z) analysis in acoustic microscopy
Author(s): Ulla Scheer; Thomas Blum; Klaus Kosbi; Siegfried Boseck
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Paper Abstract

The scanning acoustic microscope is a powerful tool for the study of the physical and elastic properties of materials. Surface and interior structures of a specimen can be imaged nondestructively. The elastic micro analysis of bulk materials and layered structures is carried out by measuring the so-called V(z) function, which includes examination of the reflection function of solid materials, measurement of the phase velocity and attenuation of leaky surface acoustic waves and determination of the elastic constants of the material. Therefore, V(z) is a very important effect in acoustic microscopy for material characterization and so its precise analysis is desirable. A wavelet based filtering of the measured V(z) curve will be shown in order to remove short period oscillations caused by internal lens reverberations. Furthermore, the continuous wavelet transform of the V(z) data indicates irregularities in the experimental setup.

Paper Details

Date Published: 11 November 1998
PDF: 6 pages
Proc. SPIE 3581, Acousto-Optics and Applications III, (11 November 1998); doi: 10.1117/12.330496
Show Author Affiliations
Ulla Scheer, Univ. of Bremen (Germany)
Thomas Blum, Univ. of Bremen (Germany)
Klaus Kosbi, Univ. of Bremen (Germany)
Siegfried Boseck, Univ. of Bremen (Germany)


Published in SPIE Proceedings Vol. 3581:
Acousto-Optics and Applications III
Antoni Sliwinski; Bogumil B. J. Linde; Piotr Kwiek, Editor(s)

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