Share Email Print

Proceedings Paper

Tapered monocapillary optics for synchrotron x-ray microfocusing
Author(s): David X. Balaic; Zwi N. M .N. Barnea; J. N. Varghese; M. Cholewa; C. T. Dillon; P. A. Lay; G. Shea-McCarthy
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The use of synchrotron x-ray sources for diffraction and fluorescence analysis has permitted the study of a sample with improved structure resolution respectively. However, even the highly-intense x-ray spectra available using synchrotron sources may be insufficient to perform some analysis on weakly-diffracting or low-concentration samples. The available x- ray intensity per unit irradiated volume and detector noise level impose a lower limit on detection sensitivity. Even where sufficient intensity is available to make a single measurement, time constraints may still preclude diffraction data collection over sufficient reciprocal space volume or high-resolution fluorescence data collection over a large sample area.

Paper Details

Date Published: 6 November 1998
PDF: 8 pages
Proc. SPIE 3449, X-Ray Microfocusing: Applications and Techniques, (6 November 1998); doi: 10.1117/12.330343
Show Author Affiliations
David X. Balaic, Univ. of Melbourne (Australia)
Zwi N. M .N. Barnea, Univ. of Melbourne (Australia)
J. N. Varghese, Biomolecular Research Institute (Australia)
M. Cholewa, Univ. of Melbourne (Australia)
C. T. Dillon, Univ. of Sydney (Australia)
P. A. Lay, Univ. of Sydney (Australia)
G. Shea-McCarthy, Brookhaven National Lab. (United States)

Published in SPIE Proceedings Vol. 3449:
X-Ray Microfocusing: Applications and Techniques
Ian McNulty, Editor(s)

© SPIE. Terms of Use
Back to Top