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Proceedings Paper

Dynamically figured Kirkpatrick Baez x-ray microfocusing optics
Author(s): Peter J. Eng; Matthew Newville; Mark L. Rivers; Stephen R. Sutton
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Paper Abstract

We present the optical designs, modeling, bender design and test results of x-ray micro- focusing optics used to micro-focus monochromatic undulator x-rays at the Advanced Photon Source (APS). The system uses two 100mm long, actively bent mirrors in a Kirkpatrick Baez arrangement. A detailed analytical model of the system's performance is described along with ray tracing result. A description of the integration of the benders into a compete micro- focusing system is provided. The system is easy to setup and use and is presently used in earth science research coupled to techniques such as micro-spectroscopy, fluorescence microprobe, and energy dispersive diffraction. The optics' performance is measured on the GeoSoilEnviroCARS microprobe experimental station at APS sector 13. Focusing tests using 10keV undulator x-rays result in a double focused beam with a horizontal and vertical full width at half maximum of 0.80micrometers X 0.85micrometers , and flux density gain greater than 105.

Paper Details

Date Published: 6 November 1998
PDF: 12 pages
Proc. SPIE 3449, X-Ray Microfocusing: Applications and Techniques, (6 November 1998); doi: 10.1117/12.330342
Show Author Affiliations
Peter J. Eng, Univ. of Chicago (United States)
Matthew Newville, Univ. of Chicago (United States)
Mark L. Rivers, Univ. of Chicago (United States)
Stephen R. Sutton, Univ. of Chicago (United States)


Published in SPIE Proceedings Vol. 3449:
X-Ray Microfocusing: Applications and Techniques
Ian McNulty, Editor(s)

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