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Proceedings Paper

Progress toward submicron hard x-ray imaging using elliptically bent mirrors and its applications
Author(s): Alastair A. MacDowell; Chang-Hasnain C. Chang; G. M. Lamble; Richard S. Celestre; J. R. Patel; Howard A. Padmore
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Paper Abstract

We have developed an x-ray microprobe facility utilizing mirror bending techniques that allow white light x-rays from the Advanced Light Source Synchrotron to be focused down to spot sizes of micron spatial dimensions. We have installed a 4 crystal monochromator prior to the micro-focusing mirrors. The monochromator is designed such that it can move out of the way of the input beam, and allows the same micron sized samples to be illuminated with either white or monochromator radiation. Illumination of the sample with white light allows for elemental mapping and Laue x-ray diffraction, while illumination of the sample with monochromatic light allows for elemental mapping, micro-x-ray absorption spectroscopy and microdiffraction. The performance of the system will be described as will some of the initial experiments that cover the various disciplines of Earth, Material and Life Sciences.

Paper Details

Date Published: 6 November 1998
PDF: 8 pages
Proc. SPIE 3449, X-Ray Microfocusing: Applications and Techniques, (6 November 1998); doi: 10.1117/12.330341
Show Author Affiliations
Alastair A. MacDowell, Lawrence Berkeley National Lab. (United States)
Chang-Hasnain C. Chang, Lawrence Berkeley National Lab. (United States)
G. M. Lamble, Lawrence Berkeley National Lab. (United States)
Richard S. Celestre, Lawrence Berkeley National Lab. (United States)
J. R. Patel, Lawrence Berkeley National Lab. and Stanford Univ. (United States)
Howard A. Padmore, Lawrence Berkeley National Lab. (United States)

Published in SPIE Proceedings Vol. 3449:
X-Ray Microfocusing: Applications and Techniques
Ian McNulty, Editor(s)

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