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Proceedings Paper

Bend magnet beamline for scanning transmission x-ray microscopy at the Advanced Light Source
Author(s): Anthony Warwick; Howard A. Padmore; Harald Ade
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Paper Abstract

A bend magnet at the advanced light source is sufficiently bright to illuminate a scanning transmission x-ray microscope, with a zone plate lens to focus the soft x-ray beam at the diffraction limit. The beam line must be carefully optimized for this one purpose of high count-rates, of the order of 1MHz, are to be achieved in the microscope. Such a design is described. The nominal resolving power is 2000 from 150eV to 600eV using a single spherical diffraction grating. Twice the resolving power is available at reduced flux, and the intensity can be traded independently against the spatial and spectral resolution.

Paper Details

Date Published: 6 November 1998
PDF: 7 pages
Proc. SPIE 3449, X-Ray Microfocusing: Applications and Techniques, (6 November 1998); doi: 10.1117/12.330337
Show Author Affiliations
Anthony Warwick, Lawrence Berkeley National Lab. (United States)
Howard A. Padmore, Lawrence Berkeley National Lab. (United States)
Harald Ade, North Carolina State Univ. (United States)


Published in SPIE Proceedings Vol. 3449:
X-Ray Microfocusing: Applications and Techniques
Ian McNulty, Editor(s)

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