Share Email Print

Proceedings Paper

Scanning microscopy end station at the ESRF x-ray microscopy beamline
Author(s): Ray Barrett; Burkhard Kaulich; Sebastian Oestreich; Jean Susini
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The ID21 x-ray microscopy beamline at the ESRF has two branchlines: one is dedicated to scanning microscopy techniques and the second to full-field imaging microscopy. The scanning x-ray microscope end station is designed for use over a relatively wide spectral range ranging from 0.2 to 8keV giving access to absorption edges from a wide range of elements of interest in both the biological and materials sciences. The microscope is operating initially with Fresnel zone plate optics and, apart from conventional absorption contrast imaging, is designed to accept a variety of complementary imaging modes. In particular considerable effort has been made to optimize the design for spectromicroscopy using both fluorescence imaging and scanning of the primary x-ray probe energy for XANES imaging. A brief overview of the beamline design is given. This is followed by a discussion of the implications of both the source characteristics and the required wide spectral range upon the optical design of the microscope and, leading from this, the technological choices which have been made. Preliminary results obtained with the microscope are presented.

Paper Details

Date Published: 6 November 1998
PDF: 11 pages
Proc. SPIE 3449, X-Ray Microfocusing: Applications and Techniques, (6 November 1998); doi: 10.1117/12.330335
Show Author Affiliations
Ray Barrett, European Synchrotron Radiation Facility (France)
Burkhard Kaulich, European Synchrotron Radiation Facility (Italy)
Sebastian Oestreich, European Synchrotron Radiation Facility (Netherlands)
Jean Susini, European Synchrotron Radiation Facility (France)

Published in SPIE Proceedings Vol. 3449:
X-Ray Microfocusing: Applications and Techniques
Ian McNulty, Editor(s)

© SPIE. Terms of Use
Back to Top