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Proceedings Paper

New stepped spherical x-ray diffractor for microprobe analysis
Author(s): M. I. Mazuritsky; Alexander V. Soldatov; Augusto Marcelli; Evgeny L. Latush
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Paper Abstract

X-ray microprobe techniques require both a good spectral resolution and a high intensity. Actually, these two competitive conditions can be obtained only by x-ray spectrometers with focusing optics made by cylindrical curved crystals or by doubly curved on spherical or toroidal surface crystal monochromators. However, these devices do not allow collection of a large solid angle and therefore the experiments are limited by the source brilliance. Here we present a special device for the analysis of the x-ray secondary emission based on a new diffractor design. The device has a special shape of the reflecting surface, i.e., a pseudo- spherical stepped surface characterized by a constant angle width per step, that allows to collect the large solid angel necessary to guarantee an intense flux for the experiments of microanalysis. We will demonstrate that the efficiency of this diffractor is superior to a commercial device of similar size having a spectral resolution of 410-4 with a potential gain of about one order of magnitude.

Paper Details

Date Published: 6 November 1998
PDF: 5 pages
Proc. SPIE 3449, X-Ray Microfocusing: Applications and Techniques, (6 November 1998); doi: 10.1117/12.330334
Show Author Affiliations
M. I. Mazuritsky, Rostov Univ. (Russia)
Alexander V. Soldatov, Rostov Univ. (Russia)
Augusto Marcelli, Lab. Nazionali de Frascati/INFN (Italy)
Evgeny L. Latush, Rostov State Univ. (Russia)


Published in SPIE Proceedings Vol. 3449:
X-Ray Microfocusing: Applications and Techniques
Ian McNulty, Editor(s)

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